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DAC
2009
ACM
16 years 7 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2004
ACM
16 years 7 months ago
Heterogeneous MP-SoC: the solution to energy-efficient signal processing
To meet conflicting flexibility, performance and cost constraints of demanding signal processing applications, future designs in this domain will contain an increasing number of a...
Tim Kogel, Heinrich Meyr
DAC
2006
ACM
16 years 7 months ago
Programming models and HW-SW interfaces abstraction for multi-processor SoC
ing models and HW-SW Interfaces Abstraction for Multi-Processor SoC Ahmed A. Jerraya TIMA Laboratory 46 Ave Felix Viallet 38031 Grenoble CEDEX, France +33476574759 Ahmed.Jerraya@im...
Ahmed Amine Jerraya, Aimen Bouchhima, Fréd&...
ISBI
2008
IEEE
16 years 7 months ago
Chromosome pairing for karyotyping purposes using mutual information
Cytogenetics is the preferred tool in the diagnosis of genetic diseases such as leukemia and detection of aquired chromosomal abnormalities, such as translocations, deletions, mon...
Artem Khmelinskii, João Sanches, Rodrigo Ve...
VLSID
2009
IEEE
108views VLSI» more  VLSID 2009»
16 years 7 months ago
Metric Based Multi-Timescale Control for Reducing Power in Embedded Systems
Abstract--Digital control for embedded systems often requires low-power, hard real-time computation to satisfy high control-loop bandwidth, low latency, and low-power requirements....
Forrest Brewer, João Pedro Hespanha, Nitin ...
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