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183
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VLSID
2005
IEEE
16 years 7 months ago
2005
IEEE
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
117
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VLSID
2004
IEEE
16 years 7 months ago
2004
IEEE
This paper focuses on the investigation of integrated CMOS and Silicon/Germanium (SiGe) devices for highspeed optical receiver circuits. In this paper, we present several competit...
164
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VLSID
2004
IEEE
16 years 7 months ago
2004
IEEE
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
208
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VLSID
2004
IEEE
16 years 7 months ago
2004
IEEE
We present a new design of an Embedded Speech Recognition System. It combines the aspects of both hardware and software design to implement a speaker dependent, isolated word, sma...
160
Voted
VLSID
2004
IEEE
16 years 7 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...