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153
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
Piecewise linear branch predictor has been demonstrated to have superior prediction accuracy; however, its huge hardware overhead prevents the predictor from being practical in the...
166
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
We present a technique for automatic verification of pipelined microprocessors using model checking. Antecedent conditioned slicing is an efficient abstraction technique for hardw...
173
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
151
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
With scaling of CMOS technologies, sub-threshold, gate and reverse biased junction band-to-band-tunneling leakage have increased dramatically. Together they account for more than 2...
173
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...