11061 search results - page 1800 / 2213 » Computer Architecture |
155
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VLSID
2008
IEEE
16 years 7 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
163
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VLSID
2008
IEEE
16 years 7 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
193
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
Leakage power is becoming a dominant contributor to the total power consumption and dual-Vth assignment is an efficient technique to decrease leakage power, for which effective de...
167
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
Boolean Satisfiability is seeing increasing use as a decision procedure in Electronic Design Automation (EDA) and other domains. Most applications encode their domain specific cons...
171
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
Performance of an application can be improved through augmenting the processor with Application specific Functional Units (AFUs). Usually a cluster of operations identified from th...