Due to skewed scaling of interconnect delay and cell delay with technology scaling, modern VLSI timing closure requires use of extensive buffer insertion. Inserting a large number...
Tung-Chieh Chen, Ashutosh Chakraborty, David Z. Pa...
Soft errors, once only of concern in memories, are beginning to affect logic as well. Determining the soft error rate (SER) of a combinational circuit involves three main masking ...
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...
High efficiency low voltage DC-DC conversion is a key enabler to the design of power-efficient integrated circuits. Typically a star configuration of the DC-DC converters, where o...
The number and magnitude of process variation sources are increasing as we scale further into the nano regime. Today's most successful response surface methods limit us to lo...