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DAC
2009
ACM
16 years 7 months ago
Improving testability and soft-error resilience through retiming
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...
Smita Krishnaswamy, Igor L. Markov, John P. Hayes
DAC
2009
ACM
16 years 7 months ago
SRAM parametric failure analysis
With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical ...
Jian Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileg...
DAC
2009
ACM
16 years 7 months ago
Spare-cell-aware multilevel analytical placement
Post-silicon validation has recently drawn designers' attention due to its increasing impacts on the VLSI design cycle and cost. One key feature of the post-silicon validatio...
Zhe-Wei Jiang, Meng-Kai Hsu, Yao-Wen Chang, Kai-Yu...
DAC
2009
ACM
16 years 7 months ago
A robust and efficient harmonic balance (HB) using direct solution of HB Jacobian
In this paper we introduce a new method of performing direct solution of the harmonic balance Jacobian. For examples with moderate number of harmonics and moderate to strong nonli...
Amit Mehrotra, Abhishek Somani
DAC
2009
ACM
16 years 7 months ago
Interconnection fabric design for tracing signals in post-silicon validation
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...
Xiao Liu, Qiang Xu
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