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210
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VLSID
2002
IEEE
16 years 8 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
166
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VLSID
2002
IEEE
16 years 8 months ago
2002
IEEE
This paper presents the Smith and Waterman Algorithm-Specific ASIC Design (SWASAD) project. This is a hardware solution that implements the S&W algorithm.. The SWASAD is an imp...
199
Voted
VLSID
2002
IEEE
16 years 8 months ago
2002
IEEE
- This work presents accurate closed-form expressions for the interconnect energy dissipation in high-speed ULSI circuits. Unlike previous works, the energy is calculated using an ...
185
Voted
VLSID
2002
IEEE
16 years 8 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
225
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VLSID
2002
IEEE
16 years 8 months ago
2002
IEEE
Directed test program-based verification or formal verification methods are usually quite ineffective on large cachecoherent, non-uniform memory access (CC-NUMA) multiprocessors b...