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VTS
1995
IEEE
105views Hardware» more  VTS 1995»
15 years 10 months ago
Cyclic stress tests for full scan circuits
To ensure the production of reliable circuits and fully testable unpackaged dies for MCMs burn-in, both dynamic and monitored, remains a feasible option. During this burn-in proce...
Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Jan...
APSCC
2008
IEEE
15 years 8 months ago
Optimizing the Execution Time of the SLA-based Workflow in the Grid with Parallel Processing Technology
Service Level Agreements (SLAs) is currently one of the major research topics in Grid Computing. Among many system components for the supporting of SLA-aware Gridbased workflow, t...
Dang Minh Quan, Jörn Altmann, Laurence Tianru...
IJCAI
1997
15 years 8 months ago
Task Ontology Makes It Easier To Use Authoring Tools
The main purpose of this paper is to illustrate the characteristics of ontology-based authoring tools for Computer Based Training (CBT) systems. It has two major advantages as fol...
Mitsuru Ikeda, Kazuhisa Seta, Riichiro Mizoguchi
PVM
2010
Springer
15 years 5 months ago
Dodging the Cost of Unavoidable Memory Copies in Message Logging Protocols
Abstract. With the number of computing elements spiraling to hundred of thousands in modern HPC systems, failures are common events. Few applications are nevertheless fault toleran...
George Bosilca, Aurelien Bouteiller, Thomas H&eacu...
DCC
2011
IEEE
15 years 1 months ago
On the correlation distribution of Delsarte-Goethals sequences
For odd integer m ≥ 3 and t = 0, 1, . . . , m−1 2 , we define Family V (t) to be a set of size 2m(t+1) containing binary sequences of period 2m+1 − 2. The nontrivial correl...
Kai-Uwe Schmidt