29046 search results - page 5449 / 5810 » Computable Models |
175
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DAC
2007
ACM
16 years 7 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
196
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Efficient energy and performance estimation of embedded software is a critical part of any system-level design flow. Macromodeling based estimation is an attempt to speed up estim...
216
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
176
Voted
DAC
2006
ACM
16 years 7 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
189
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
Networks-on-Chip (NoC) architectures provide a scalable solution to on-chip communication problem but the bandwidth offered by NoCs can be utilized efficiently only in presence of...