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HICSS
2008
IEEE
94views Biometrics» more  HICSS 2008»
16 years 1 months ago
Reference Values for Dynamic Calibration of PMUs
1 This paper discusses measurements of the dynamic performance of electric power Phasor Measurement Units, PMUs, and their relation to the requirements of the IEEE Synchrophasor St...
Gerard Stenbakken, Tom Nelson, Ming Zhou, Virgilio...
GLOBECOM
2006
IEEE
16 years 27 days ago
Harnessing the Parity of Multiple Errors in End-to-End MAC Schemes
— We present the results of simulation experiments that compare end-to-end error management (used in controlled access MAC protocols) against hop-by-hop error management (used in...
Ghassen Ben Brahim, Bilal Khan, Ala I. Al-Fuqaha, ...
DATE
2010
IEEE
156views Hardware» more  DATE 2010»
15 years 9 months ago
Defect aware X-filling for low-power scan testing
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
S. Balatsouka, V. Tenentes, Xrysovalantis Kavousia...
ASPDAC
2005
ACM
92views Hardware» more  ASPDAC 2005»
15 years 8 months ago
Sleep transistor sizing using timing criticality and temporal currents
— Power gating is a circuit technique that enables high performance and low power operation. One of the challenges in power gating is sizing the sleep transistor which is used to...
Anand Ramalingam, Bin Zhang, Anirudh Devgan, David...
SOSP
2001
ACM
16 years 3 months ago
Real-Time Dynamic Voltage Scaling for Low-Power Embedded Operating Systems
In recent years, there has been a rapid and wide spread of nontraditional computing platforms, especially mobile and portable computing devices. As applications become increasingl...
Padmanabhan Pillai, Kang G. Shin