Reliability-aware power management (RAPM) schemes, which consider the negative effects of voltage scaling on system reliability, were recently studied to save energy while preserv...
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
This paper presents a novel compiler directed technique to reduce the register pressure and power of the register file by releasing registers early. The compiler identifies regi...
Timothy M. Jones, Michael F. P. O'Boyle, Jaume Abe...
The identification of genes that influence the risk of common, complex diseases primarily through interactions with other genes and environmental factors remains a statistical and ...
Marylyn D. Ritchie, Christopher S. Coffey, Jason H...
We study the MIMO broadcast channel and compare the achievable throughput for the optimal strategy of dirty paper coding to that achieved with sub-optimal and lower complexity lin...