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DATE
2008
IEEE
109views Hardware» more  DATE 2008»
16 years 24 days ago
Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
Jeremy Lee, Sumit Narayan, Mike Kapralos, Mohammad...
HICSS
2008
IEEE
163views Biometrics» more  HICSS 2008»
16 years 23 days ago
Building a Test Suite for Web Application Scanners
This paper describes the design of a test suite for thorough evaluation of web application scanners. Web application scanners are automated, black-box testing tools that examine w...
Elizabeth Fong, Romain Gaucher, Vadim Okun, Paul E...
ICASSP
2008
IEEE
16 years 23 days ago
High-performance scheduling algorithm for partially parallel LDPC decoder
In this paper, we propose a new scheduling algorithm for the overlapped message passing decoding, which can be applied to general low-density parity check (LDPC) codes. The partia...
Cheng-Zhou Zhan, Xin-Yu Shih, An-Yeu Wu
ICPR
2008
IEEE
16 years 23 days ago
Application of the wrapper framework for image object detection
Tools for automatic image understanding for managing operator workloads are essential. One common task for image analysts is the scanning large collections of real-time images loo...
Michael Farmer
ICPR
2008
IEEE
16 years 23 days ago
Challenging issues in iterative intelligent medical search
Searching for medical information on the Web is highly popular these days. To facilitate ordinary people to perform medical search and preliminary disease self-diagnosis, we have ...
Gang Luo, Chunqiang Tang