This paper describes a two pass algorithm capable of computing solutions to the global illumination in general environments (diffuse or glossy surfaces, anisotropically scattering...
We present a low-cost on-line test methodology for RTL controller-datapath pairs, based on the notion of path invariance. The fundamental observation supporting the proposed metho...
Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailogl...
We shall discuss the idea of finding all rational points on a curve C by first finding an associated collection of curves whose rational points cover those of C. This classical ...
Modeling of 3D objects from image sequences is a challenging problem and has been a research topic for many years. Important theoretical and algorithmic results were achieved that...
Marc Pollefeys, Reinhard Koch, Maarten Vergauwen, ...
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...