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VLSI
2005
Springer
15 years 11 months ago
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Erik Larsson, Stina Edbom
APSEC
2005
IEEE
15 years 11 months ago
Systematic Use Case Interviews for Specification of Automotive Systems
Automotive software systems are becoming increasingly complex, driven both by advances in technology and by demands for more powerful applications. The design of such complex syst...
Shariful Islam, Hannes Omasreiter
ICCD
2002
IEEE
164views Hardware» more  ICCD 2002»
16 years 2 months ago
Locating Tiny Sensors in Time and Space: A Case Study
— As the cost of embedded sensors and actuators drops, new applications will arise that exploit high density networks of small devices capable of a variety of sensing tasks. Alth...
Lewis Girod, Vladimir Bychkovskiy, Jeremy Elson, D...
VIS
2006
IEEE
156views Visualization» more  VIS 2006»
16 years 7 months ago
ClearView: An Interactive Context Preserving Hotspot Visualization Technique
Volume rendered imagery often includes a barrage of 3D information like shape, appearance and topology of complex structures, and it thus quickly overwhelms the user. In particular...
Jens Krüger, Jens Schneider, Rüdiger Westerman...
DOCENG
2007
ACM
15 years 10 months ago
Logical document conversion: combining functional and formal knowledge
We present in this paper a method for document layout analysis based on identifying the function of document elements (what they do). This approach is orthogonal and complementary...
Hervé Déjean, Jean-Luc Meunier