10891 search results - page 464 / 2179 » Combining Model Reductions |
177
click to vote
ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
167
click to vote
ICCD
2000
IEEE
16 years 3 months ago
2000
IEEE
Most well-performing load value predictors are hybrids that combine multiple predictors into one. Such hybrids are often large. To reduce their size and to improve their performan...
161
click to vote
ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
Abstract—On-chip power density and temperature are rising exponentially with decreasing feature sizes. This alarming trend calls for temperature management at every level of syst...
187
click to vote
ISQED
2009
IEEE
16 years 1 months ago
2009
IEEE
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability...
197
click to vote
ICAC
2008
IEEE
16 years 1 months ago
2008
IEEE
Virtualization and consolidation are two complementary techniques widely adopted in a global strategy to reduce system management complexity. In this paper we show how two simple ...