2573 search results - page 371 / 515 » Combinations of Modal Logics |
152
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
156
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
169
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CCS
2007
ACM
16 years 20 days ago
2007
ACM
Security automata are a variant of B¨uchi automata used to specify security policies that can be enforced by monitoring system execution. In this paper, we propose using CSP-OZ, ...
156
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ISQED
2006
IEEE
16 years 15 days ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
149
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MICRO
1998
IEEE
15 years 10 months ago
1998
IEEE
The fill unit is the structure which collects blocks of instructions and combines them into multi-block segments for storage in a trace cache. In this paper, we expand the role of...