In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
We propose a fuzzy logic recursive scheme for motion detection and spatiotemporal filtering that can deal with the Gaussian noise and unsteady illumination conditions in both the t...
Vladimir Zlokolica, Aleksandra Pizurica, Wilfried ...
Cryptographic algorithms play a key role in computer security and the formal analysis of their robustness is of utmost importance. Yet, logic and automated reasoning tools are seld...
Rising Field Programmable Gate Array (FPGA) market volumes combined with increasing industrial popularity have driven prices down and improved capability to the point that FPGA ha...
There has been great progress in recent years on developing effective techniques for reasoning about program equivalence in ML-like languages—that is, languages that combine fea...
Chung-Kil Hur, Derek Dreyer, Georg Neis, Viktor Va...