Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
Several caching techniques have been used to reduce the bandwidth consumption and to provide faster answers in P2P systems. In this paper, we address the problem of reducing unnec...
We propose a novel privacy-preserving nonlinear support vector machine (SVM) classifier for a data matrix A whose columns represent input space features and whose individual rows ...
Deterministic parsing has emerged as an effective alternative for complex parsing algorithms which search the entire search space to get the best probable parse tree. In this pape...
In this paper, we introduce two new formulations for multi-class multi-kernel relevance vector machines (mRVMs) that explicitly lead to sparse solutions, both in samples and in nu...
Theodoros Damoulas, Yiming Ying, Mark A. Girolami,...