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ASPDAC
2007
ACM
140views Hardware» more  ASPDAC 2007»
15 years 10 months ago
An Architecture for Combined Test Data Compression and Abort-on-Fail Test
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
Erik Larsson, Jon Persson
CLUSTER
2007
IEEE
15 years 10 months ago
A feasibility analysis of power-awareness and energy minimization in modern interconnects for high-performance computing
High-performance computing (HPC) systems consume a significant amount of power, resulting in high operational costs, reduced reliability, and wasting of natural resources. Therefor...
Reza Zamani, Ahmad Afsahi, Ying Qian, V. Carl Hama...
ICDCS
2010
IEEE
15 years 10 months ago
CONTRACT: Incorporating Coordination into the IP Network Control Plane
—This paper presents the CONTRACT framework to address a fundamental deficiency of the IP network control plane, namely the lack of coordination between an IGP and other control...
Zheng Cai, Florin Dinu, Jie Zheng, Alan L. Cox, T....
ICDCS
2010
IEEE
15 years 10 months ago
Divide and Conquer Algorithms for Publish/Subscribe Overlay Design
Abstract—Overlay network design for topic-based publish/subscribe systems is of primary importance because the overlay directly impacts the system’s performance. Determining a ...
Chen Chen, Hans-Arno Jacobsen, Roman Vitenberg
WCNC
2010
IEEE
15 years 10 months ago
Quantifying the Overhead Due to Routing Probes in Multi-Rate WMNs
—The selection of high-throughput routes is a key element towards improving the performance of wireless multihop networks. While several routing metrics have been proposed in the...
Ioannis Broustis, Konstantinos Pelechrinis, Dimitr...