A BIST method measures accumulated jitter over N periods and requires no external references. Simulation using a 0.25um process shows a 625MHz - 1GHz input range with resolution o...
Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan...
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...
Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. ...
The microarchitectural design space of a new processor is too large for an architect to evaluate in its entirety. Even with the use of statistical simulation, evaluation of a sing...
Christophe Dubach, Timothy M. Jones, Michael F. P....
This paper describes a new design methodology to analyze the on-chip power supply noise for high performance microprocessors. Based on an integrated package-level and chip-level p...
Multi-threshold CMOS is an increasingly popular circuit approach that enables high performance and low power operation. However, no methodologies have been developed to size the h...
James Kao, Anantha Chandrakasan, Dimitri Antoniadi...