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ITC
2003
IEEE
102views Hardware» more  ITC 2003»
15 years 11 months ago
CMOS Built-In Test Architecture for High-Speed Jitter Measurement
A BIST method measures accumulated jitter over N periods and requires no external references. Simulation using a 0.25um process shows a 625MHz - 1GHz input range with resolution o...
Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan...
ISCA
2008
IEEE
132views Hardware» more  ISCA 2008»
16 years 28 days ago
Online Estimation of Architectural Vulnerability Factor for Soft Errors
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...
Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. ...
MICRO
2007
IEEE
135views Hardware» more  MICRO 2007»
16 years 24 days ago
Microarchitectural Design Space Exploration Using an Architecture-Centric Approach
The microarchitectural design space of a new processor is too large for an architect to evaluate in its entirety. Even with the use of statistical simulation, evaluation of a sing...
Christophe Dubach, Timothy M. Jones, Michael F. P....
DAC
1997
ACM
15 years 10 months ago
Power Supply Noise Analysis Methodology for Deep-Submicron VLSI Chip Design
This paper describes a new design methodology to analyze the on-chip power supply noise for high performance microprocessors. Based on an integrated package-level and chip-level p...
Howard H. Chen, David D. Ling
DAC
1997
ACM
15 years 10 months ago
Transistor Sizing Issues and Tool For Multi-Threshold CMOS Technology
Multi-threshold CMOS is an increasingly popular circuit approach that enables high performance and low power operation. However, no methodologies have been developed to size the h...
James Kao, Anantha Chandrakasan, Dimitri Antoniadi...