6656 search results - page 210 / 1332 » Change, Change, Change: Three Approaches |
142
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ICCD
2005
IEEE
16 years 3 months ago
2005
IEEE
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
136
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VLDB
2005
ACM
16 years 1 days ago
2005
ACM
With the advent of chip multiprocessors, exploiting intra-transaction parallelism is an attractive way of improving transaction performance. However, exploiting intra-transaction ...
178
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WPES
2004
ACM
15 years 12 months ago
2004
ACM
In this paper, we introduce a general framework for microdata and three disclosure risk measures (minimal, maximal and weighted). We classify the attributes from a given microdata...
163
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WSC
2008
15 years 9 months ago
2008
Within the last months the semiconductor plant of Infineon in Dresden has converted to a pure manufacturer of logic products. With it, premises for production control have changed...
181
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FGR
2008
IEEE
15 years 8 months ago
2008
IEEE
Illumination invariance remains the most researched, yet the most challenging aspect of automatic face recognition. In this paper we investigate the discriminative power of colour...