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163
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DATE
2009
IEEE
16 years 28 days ago
2009
IEEE
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
164
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ICIW
2009
IEEE
16 years 25 days ago
2009
IEEE
Today’s cross-organizations are increasingly coordinating their capabilities in the quest of dynamically adaptable and thus highly competitive realistic services. Unfortunately,...
158
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ICSM
2009
IEEE
16 years 25 days ago
2009
IEEE
Modeling the navigation structure of a dynamic web application is a challenging task because of the presence of dynamic pages. In particular, there are two problems to be dealt wi...
198
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ICST
2009
IEEE
16 years 25 days ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
168
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MICRO
2009
IEEE
16 years 25 days ago
2009
IEEE
Continued technology scaling is resulting in systems with billions of devices. Unfortunately, these devices are prone to failures from various sources, resulting in even commodity...