10182 search results - page 187 / 2037 » Case Studies |
236
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...
123
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
156
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
Abstract: We discuss the development of Built-In SelfTest (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000...
156
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IV
2003
IEEE
15 years 11 months ago
2003
IEEE
A visualisation system that deals with two modalities of information – numerical and textual – is presented. The current application domain is that of prediction in financial ...
148
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MSE
2003
IEEE
15 years 11 months ago
2003
IEEE
In this paper a review of development of manpower in VLSI in India is attempted. In the last decade of the 20th Century, rapid strides have been done in Micro-Electronics in India...