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» Carving differential unit test cases from system test cases
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DATE
2002
IEEE
89views Hardware» more  DATE 2002»
15 years 11 months ago
A Hierarchical Test Scheme for System-On-Chip Designs
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pi...
CIMCA
2005
IEEE
15 years 8 months ago
Fuzzy System Modeling with the Genetic and Differential Evolutionary Optimization
This paper compares the performance of two provably successful evolutionary optimization tools in the optimization of a Fuzzy-Rule-Base (FRB) for the three well known fuzzy modeli...
Mehmet Bodur, Adnan Acan, Talip Akyol
SIGIR
2004
ACM
15 years 11 months ago
Forming test collections with no system pooling
Forming test collection relevance judgments from the pooled output of multiple retrieval systems has become the standard process for creating resources such as the TREC, CLEF, and...
Mark Sanderson, Hideo Joho
SEW
2007
IEEE
16 years 11 days ago
Testing Patterns
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
Neelam Soundarajan, Jason O. Hallstrom, Adem Delib...
AICCSA
2001
IEEE
83views Hardware» more  AICCSA 2001»
15 years 9 months ago
A Measure for Component Interaction Test Coverage
A trend in software development is to assemble a system from a number of components. These may be either available commercially off-the-shelf, or by the use of network-based resou...
Alan W. Williams, Robert L. Probert