2210 search results - page 228 / 442 » CLEF 2001 - Overview of Results |
145
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ASPDAC
2001
ACM
15 years 10 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
206
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ASYNC
2001
IEEE
15 years 10 months ago
2001
IEEE
This paper describes the synthesis and hardware implementation of a signal-type asynchronous data communication mechanism (ACM). Such an ACM can be used in systems where a data-dr...
186
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ATS
2001
IEEE
15 years 10 months ago
2001
IEEE
Testing embedded cores in a System-on-a-chip necessitates the use of a Test Access Mechanism, which provides for transportation of the test data between the chip and the core I/Os...
173
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AVBPA
2001
Springer
15 years 10 months ago
2001
Springer
We propose a novel approach to face identification and verification based on the Error Correcting Output Coding (ECOC) classifier design concept. In the training phase the client s...
147
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BIBE
2001
IEEE
15 years 10 months ago
2001
IEEE
Parkinson's disease (PD) belongs to a class of neurodegenerative diseases that affect both the patient's speech and motor capabilities. To date, PD diagnosis and the det...