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DATE
2006
IEEE
134views Hardware» more  DATE 2006»
16 years 15 days ago
Power constrained and defect-probability driven SoC test scheduling with test set partitioning
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
Zhiyuan He, Zebo Peng, Petru Eles
DATE
2006
IEEE
116views Hardware» more  DATE 2006»
16 years 15 days ago
SoC: fuelling the hopes of the mobile industry
Uwe Lambrette, Booz Allen Hamilton