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191
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DATE
2003
IEEE
135views Hardware» more  DATE 2003»
16 years 17 days ago
Creating Value Through Test
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
Erik Jan Marinissen, Bart Vermeulen, Robert Madge,...
EDOC
2003
IEEE
16 years 17 days ago
A Software Architecture for Industrial Automation
The Aspect Integrator Platform (AIP) from ABB was designed to build the next generation of industrial automation applications. This platform is part of a set of products that prov...
Rodrigo García García, Esther Gelle,...
215
Voted
MPC
2010
Springer
152views Mathematics» more  MPC 2010»
16 years 1 days ago
Lucy-n: a n-Synchronous Extension of Lustre
Synchronous functional languages such as Lustre or Lucid Synchrone define a restricted class of Kahn Process Networks which can be executed with no buffer. Every expression is as...
Louis Mandel, Florence Plateau, Marc Pouzet
NANONET
2009
Springer
199views Chemistry» more  NANONET 2009»
15 years 12 months ago
Through Silicon Via-Based Grid for Thermal Control in 3D Chips
3D stacked chips have become a promising integration technology for modern systems. The complexity reached in multi-processor systems has increased the communication delays between...
José L. Ayala, Arvind Sridhar, Vinod Pangra...
252
Voted
WCRE
1999
IEEE
15 years 11 months ago
Chava: Reverse Engineering and Tracking of Java Applets
Java applets have been used increasingly on web sites to perform client-side processing and provide dynamic content. While many web site analysis tools are available, their focus ...
Jeffrey L. Korn, Yih-Farn Chen, Eleftherios Koutso...
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