1343 search results - page 165 / 269 » Bounded-lifetime integrated circuits |
175
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DAC
2009
ACM
16 years 1 months ago
2009
ACM
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...
191
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
192
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FPGA
2005
ACM
16 years 1 days ago
2005
ACM
Creating a new FPGA is a challenging undertaking because of the significant effort that must be spent on circuit design, layout and verification. It currently takes approximately ...
282
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Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
200
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
As power consumption of the clock tree in modern VLSI designs tends to dominate, measures must be taken to keep it under control. This paper introduces an approach for reducing cl...