1343 search results - page 155 / 269 » Bounded-lifetime integrated circuits |
160
click to vote
ESWA
2007
15 years 6 months ago
2007
Packaging is classified as one of back-end processes in the integrated circuits (ICs) manufacturing, highly capital-intensive and involves complex processes. Unlike the front-end...
153
click to vote
ET
2007
15 years 6 months ago
2007
Abstract In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an osci...
160
click to vote
TCAD
2008
15 years 6 months ago
2008
Abstract--Advances in very large-scale integration technology make clock skew more susceptible to process variations. Notwithstanding efficient exact zero-skew algorithms, clock sk...
166
click to vote
TCAD
2008
15 years 6 months ago
2008
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...
190
click to vote
HEURISTICS
2002
15 years 6 months ago
2002
In this paper, we present the parallelization of tabu search on a network of workstations using PVM. Two parallelization strategies are integrated: functional decomposition strate...