1343 search results - page 150 / 269 » Bounded-lifetime integrated circuits |
188
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
With 90nm CMOS in production and 65nm testing in progress, power has been pushed to the forefront of design metrics. This paper will outline practical techniques that are used to ...
168
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
Methodology, EDA Flow, scripts, and documentation plays a tremendous role in the deployment and standardization of advanced design techniques. In this paper we focus not only on l...
163
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
We present an efficient and accurate gate sizing tool that employs a novel piecewise convex delay model, handling both rise and fall delays, for static CMOS gates. The delay model...
186
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
212
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CVPR
2008
IEEE
15 years 8 months ago
2008
IEEE
Most digital still color cameras use a single electronic sensor (CCD or CMOS) overlaid with a color filter array. At each pixel location only one color sample is taken, and the ot...