1343 search results - page 149 / 269 » Bounded-lifetime integrated circuits |
176
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DAC
2010
ACM
15 years 9 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
160
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GLVLSI
2010
IEEE
15 years 8 months ago
2010
IEEE
This paper describes a physics-based semi-analytical model for Schottky-barrier carbon nanotube (CNT) and graphene nanoribbon (GNR) transistors. The model includes the treatment o...
174
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ASPDAC
2005
ACM
15 years 8 months ago
2005
ACM
Abstract— Regular structures are present in many types of circuits. If this structure can be identified and utilized, performance can be improved dramatically. In this paper, we...
163
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
We propose a hierarchical mixed signal design methodology based on the principles of Platform-Based Design (PBD). The methodology is a meet-in-the-middle approach where design com...
172
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
Although a lot of research efforts have been made in the minimization of the total power consumption caused by the clock tree, no attention has been paid to the minimization of th...