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» Bounded-lifetime integrated circuits
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DAC
2004
ACM
16 years 7 months ago
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
Goeran Jerke, Jürgen Scheible, Jens Lienig
GLVLSI
2005
IEEE
122views VLSI» more  GLVLSI 2005»
16 years 3 days ago
Thermal aware cell-based full-chip electromigration reliability analysis
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...
Syed M. Alam, Donald E. Troxel, Carl V. Thompson
VTS
2000
IEEE
95views Hardware» more  VTS 2000»
15 years 11 months ago
Word Voter: A New Voter Design for Triple Modular Redundant Systems
Redundancy techniques are commonly used to design dependable systems to ensure high reliability, availability and data integrity. Triple Modular Redundancy (TMR) is a widely used ...
Subhasish Mitra, Edward J. McCluskey
ISLPED
2010
ACM
231views Hardware» more  ISLPED 2010»
15 years 6 months ago
3D-nonFAR: three-dimensional non-volatile FPGA architecture using phase change memory
Memories play a key role in FGPAs in the forms of both programming bits and embedded memory blocks. FPGAs using non-volatile memories have been the focus of attention with zero bo...
Yibo Chen, Jishen Zhao, Yuan Xie
CIBCB
2007
IEEE
16 years 25 days ago
Motifs and Modules in Fractured Functional Yeast Networks
The integration of diverse data sets into probabilistic functional networks is an active and important area of research in systems biology. In this paper we fracture a previously p...
Jennifer Hallinan, Anil Wipat