1343 search results - page 142 / 269 » Bounded-lifetime integrated circuits |
157
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DATE
2005
IEEE
16 years 3 days ago
2005
IEEE
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at e...
149
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DSN
2005
IEEE
16 years 3 days ago
2005
IEEE
1 In sub-micron technology circuits high integration levels coupled with the increased sensitivity to soft errors even at ground level make the task of guaranteeing systems’ depe...
158
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SBCCI
2004
ACM
15 years 12 months ago
2004
ACM
This paper presents a design methodology for RF CMOS Low Noise Amplifiers (LNA). This methodology uses a current–based MOSFET model, which allows a detailed analysis of an LNA f...
170
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ISMVL
2003
IEEE
15 years 11 months ago
2003
IEEE
A new multiple-valued current-mode (MVCM) integrated circuit based on dynamic source-coupled logic (SCL) is proposed for low-power VLSI applications. The use of a precharge-evalua...
164
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
—Bug-free first silicon is not guaranteed by the existing pre-silicon verification techniques. To have impeccable products, it is now required to identify any bug as soon as the ...