6404 search results - page 913 / 1281 » Blocks |
200
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ATS
2005
IEEE
16 years 14 days ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
142
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CCGRID
2005
IEEE
16 years 14 days ago
2005
IEEE
This paper focuses on the scheduling of multiple-wavelength lightpaths and outlines an algorithm to provide increased simultaneous allocations of lightpaths on the Lambda-Grid. Se...
160
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CODES
2005
IEEE
16 years 14 days ago
2005
IEEE
In this paper, we present a new architectural concept for network processors called FlexPath NP. The central idea behind FlexPath NP is to systematically map network processor (NP...
155
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CODES
2005
IEEE
16 years 14 days ago
2005
IEEE
This paper describes the design of a low-cost, low-power smart imaging core that can be embedded in cameras. The core integrates an ARM 9 processor, a camera interface and two spe...
166
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CSMR
2005
IEEE
16 years 14 days ago
2005
IEEE
A domain-specific visual language, Function Block Language (FBL), is used in Metso Automation for writing automation control programs. The same engineering environment is used for...