5604 search results - page 541 / 1121 » Becoming Increasingly Reliable |
160
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DAC
2003
ACM
16 years 8 months ago
2003
ACM
Noise affects circuit operation by increasing gate delays and causing latches to capture incorrect values. This paper proposes a method of characterizing correlation of signal tra...
195
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DAC
2003
ACM
16 years 8 months ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
200
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DAC
2005
ACM
16 years 8 months ago
2005
ACM
Achieving design closure is one of the biggest headaches for modern VLSI designers. This problem is exacerbated by high-level design automation tools that ignore increasingly impo...
191
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DAC
2005
ACM
16 years 8 months ago
2005
ACM
The increased deployment of System-on-Chip designs has drawn attention to the limitations of on-chip interconnects. As a potential solution to these limitations, Networks-on -Chip...
213
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DAC
2006
ACM
16 years 8 months ago
2006
ACM
Modern high performance processors employ advanced techniques for thermal management, which rely on accurate readings of on-die thermal sensors. As the importance of thermal effec...