5604 search results - page 516 / 1121 » Becoming Increasingly Reliable |
190
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DAC
2006
ACM
16 years 8 months ago
2006
ACM
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures. To improve via yield and reliability, redundant-via insertion is a highl...
212
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DAC
2006
ACM
16 years 8 months ago
2006
ACM
Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
189
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SIGSOFT
2005
ACM
16 years 7 months ago
2005
ACM
There is an increasing interest in techniques that support measurement and analysis of fielded software systems. One of the main goals of these techniques is to better understand ...
165
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VLSID
2002
IEEE
16 years 7 months ago
2002
IEEE
Increasing complexity of the functionalities and the resultant growth in number of gates integrated in a chip coupled with shrinking geometries and short cycle time requirements br...
215
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ICSE
2008
IEEE-ACM
16 years 7 months ago
2008
IEEE-ACM
E-businesses are increasingly facing the need of porting the provision of their e-services to mobile customers. Evolving requirements, such as reliability, security, scalability, ...