5604 search results - page 316 / 1121 » Becoming Increasingly Reliable |
170
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PERCOM
2006
ACM
16 years 6 months ago
2006
ACM
This paper introduces MobiCare ? a novel service architecture that enables a wide range of health-related services for efficient and mobile patient care. These services include: (...
188
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ICCD
2001
IEEE
16 years 3 months ago
2001
IEEE
Abstract-- Scaling the minimum feature size of VLSI circuits to sub-quarter micron and its clock frequency to 2GHz has caused crosstalk noise to become a serious problem, that degr...
143
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
161
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
157
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ISQED
2009
IEEE
16 years 1 months ago
2009
IEEE
—As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such a...