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158
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
— In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and response transportation. An efficient algorithm for the gen...
160
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
The use of CMOS nanometer technologies at 65 nm and below will pose serious challenges on the design of mixed-signal integrated systems in the very near future. Rising design comp...
147
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
As technology enters the nanometer territory, the antenna effect plays an important role in determining the yield and reliability of a VLSI circuit. Diode insertion and jumper in...
198
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CVPR
2010
IEEE
16 years 3 months ago
2010
IEEE
It has been shown that the 3D shape of a deformable surface in an image can be recovered by establishing correspondences between that image and a reference one in which the shape ...
153
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
Abstract—Advances in chip-multiprocessor processing capabilities has led to an increased power consumption and temperature hotspots. Maintaining the on-chip temperature is import...