5604 search results - page 202 / 1121 » Becoming Increasingly Reliable |
177
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ATS
2009
IEEE
15 years 4 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
329
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PLDI
2009
ACM
16 years 7 months ago
2009
ACM
Inefficient use of memory, including leaks and bloat, remain a significant challenge for C and C++ developers. Applications with these problems become slower over time as their wo...
305
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ICDE
2009
IEEE
16 years 8 months ago
2009
IEEE
Data outsourcing or database as a service is a new paradigm for data management in which a third party service provider hosts a database as a service. The service provides data man...
197
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CODES
2009
IEEE
16 years 1 months ago
2009
IEEE
Since flash memory has many attractive characteristics such as high performance, non-volatility, low power consumption and shock resistance, it has been widely used as storage med...
181
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ASPDAC
2005
ACM
16 years 3 days ago
2005
ACM
The progressive trend of fabrication technologies towards the nanometer regime has created a number of new physical design challenges for computer architects. Design complexity, u...