5604 search results - page 157 / 1121 » Becoming Increasingly Reliable |
180
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MICRO
2007
IEEE
16 years 22 days ago
2007
IEEE
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
152
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ISQED
2006
IEEE
16 years 14 days ago
2006
IEEE
The increase in packing density has led to a higher power density in the chip which in turn has led to an increase in temperature on the chip. Temperature affects reliability, per...
176
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INFOCOM
2005
IEEE
16 years 1 days ago
2005
IEEE
—The presence of heterogeneous nodes (i.e., nodes with an enhanced energy capacity or communication capability) in a sensor network is known to increase network reliability and l...
178
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RTAS
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper presents a novel approach for calculating a probabilistic worst-case response-time for messages in the Controller Area Network (CAN). CAN uses a bit-stuffing mechanism...
177
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DAC
2004
ACM
15 years 10 months ago
2004
ACM
There is an increased dominance of intra-die process variations, creating a need for an accurate and fast statistical timing analysis. Most of the recent proposed approaches assum...