5604 search results - page 126 / 1121 » Becoming Increasingly Reliable |
146
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ASPDAC
2008
ACM
15 years 8 months ago
2008
ACM
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
173
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ISCA
2012
IEEE
13 years 8 months ago
2012
IEEE
To address the real-time processing needs of large and growing amounts of data, modern software increasingly uses main memory as the primary data store for critical information. T...
131
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FUZZIEEE
2007
IEEE
16 years 22 days ago
2007
IEEE
In this work an improved scheme for eliminating impulsive noise of varying strengths from corrupted images is proposed. A neural network is employed to classify the corrupted and n...
142
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CORR
2010
Springer
15 years 6 months ago
2010
Springer
Abstract. The Library of Babel, described by Jorge Luis Borges, stores an enormous amount of information. The Library exists ab aeterno. Wikipedia, a free online encyclopaedia, bec...
122
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VLSID
2005
IEEE
16 years 6 months ago
2005
IEEE
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...