4072 search results - page 581 / 815 » Becoming Increasingly Reactive |
177
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ISCA
2011
IEEE
14 years 10 months ago
2011
IEEE
As the number of cores on a single-chip grows, scalable barrier synchronization becomes increasingly difficult to implement. In software implementations, such as the tournament ba...
182
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ISQED
2011
IEEE
14 years 10 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
189
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ISQED
2011
IEEE
14 years 10 months ago
2011
IEEE
Due to the dramatic increase in design complexity, verifying the functional correctness of a circuit is becoming more difficult. Therefore, bugs may escape all verification effo...
319
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ISQED
2011
IEEE
14 years 10 months ago
2011
IEEE
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
155
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CACM
2011
14 years 10 months ago
2011
Disk-oriented approaches to online storage are becoming increasingly problematic: they do not scale gracefully to meet the needs of large-scale Web applications, and improvements ...