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DATE
2006
IEEE
115views Hardware» more  DATE 2006»
16 years 27 days ago
Optimal periodic testing of intermittent faults in embedded pipelined processor applications
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
DELTA
2006
IEEE
16 years 27 days ago
Minimizing Simultaneous Switching Noise (SSN) using Modified Odd/Even Bus Invert Method
In high speed digital circuits, the inductive effect is more dominant compared to capacitive effect. In particular, as the technology is shrinking, the spacing between interconnec...
K. S. Sainarayanan, J. V. R. Ravindra, M. B. Srini...
DFT
2006
IEEE
92views VLSI» more  DFT 2006»
16 years 27 days ago
Low-Cost Hardening of Image Processing Applications Against Soft Errors
Image processing systems are increasingly used in safetycritical applications, and their hardening against soft errors becomes an issue. We propose a methodology to identify soft ...
Ilia Polian, Bernd Becker, Masato Nakasato, Satosh...
DIAL
2006
IEEE
104views Image Analysis» more  DIAL 2006»
16 years 27 days ago
Image Interpolation using Mathematical Morphology
—We present a new method for interpolating binary images that outperforms existing techniques. Bitmapped images have a specific horizontal and vertical resolution. When we wish ...
Alessandro Ledda, Hiêp Quang Luong, Wilfried...
DSD
2006
IEEE
113views Hardware» more  DSD 2006»
16 years 27 days ago
Lifetime Analysis in Heterogeneous Sensor Networks
Wireless sensor networks (WSN) are composed of battery-driven communication entities performing multiple, usually different tasks. In order to complete a given task, all sensor no...
Falko Dressler, Isabel Dietrich