Path delay fault testing becomes increasingly important due to higher clock rates and higher process variability caused by shrinking geometries. Achieving high-coverage path delay...
Puneet Gupta, Andrew B. Kahng, Ion I. Mandoiu, Pun...
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
Mobile phones are becoming increasingly popular as a means of information access while on-the-go. Mobile users are likely to be interested in locating different types of content. ...
Malware is every malicious code that has the potential to harm any computer or network. The amount of malware is increasing faster every year and poses a serious security threat. H...
Igor Santos, Felix Brezo, Javier Nieves, Yoseba K....
Deep submicron processes have allowed FPGAs to grow in complexity and speed. However, such technology scaling has caused FPGAs to become more susceptible to the effects of process...