4072 search results - page 341 / 815 » Becoming Increasingly Reactive |
201
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DAC
2008
ACM
16 years 7 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
163
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DAC
2007
ACM
16 years 7 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
154
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DAC
2001
ACM
16 years 7 months ago
2001
ACM
In order to meet the high throughput requirements of applications exhibiting high ILP, VLIW ASIPs may increasingly include large numbers of functional unitsFUs. Unfortunately, `sw...
170
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
With the scaling of technology, power grid noise is becoming increasingly significant for circuit performance. A typical power grid circuit contains millions of linear elements, m...
156
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
With deep-sub-micron (DSM) technology, statistical timing analysis becomes increasingly crucial to characterize signal transmission over global interconnect wires. In this paper, ...