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170
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DATE
2007
IEEE
16 years 25 days ago
2007
IEEE
This paper introduces a method and tool-support for the automatic analysis and verification of hybrid and embedded control systems, whose continuous dynamics are often modelled u...
149
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DATE
2007
IEEE
16 years 25 days ago
2007
IEEE
Errors in timing closure process during the physical design stage may result in systematic silicon failures, such as scan chain hold time violations, which prohibit the test of ma...
159
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DDECS
2007
IEEE
16 years 25 days ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
194
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ICC
2007
IEEE
16 years 25 days ago
2007
IEEE
— This paper deals with a system level design solution to support information gathering in the presence of a mobile querying node that experiences frequent disconnections from a ...
185
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ICPPW
2007
IEEE
16 years 24 days ago
2007
IEEE
— Peer-to-Peer (P2P) technologies have found much success in applications like file distributions, and its adoption in live video streaming has recently attracted significant a...