5578 search results - page 171 / 1116 » Base Class Injection |
177
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ATS
2003
IEEE
15 years 11 months ago
2003
IEEE
Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of thes...
149
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KBSE
2003
IEEE
15 years 11 months ago
2003
IEEE
We present a method for performing fault localization using similar program spectra. Our method assumes the existence of a faulty run and a larger number of correct runs. It then ...
245
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DANCE
2002
IEEE
15 years 11 months ago
2002
IEEE
Active networks allow their users to inject customized programs into the nodes of the network. An extreme case, in which we are most interested, replaces packets with “capsulesâ...
160
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DFT
2002
IEEE
15 years 11 months ago
2002
IEEE
We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
225
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VTS
2000
IEEE
15 years 10 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...