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MPC
2004
Springer
155views Mathematics» more  MPC 2004»
15 years 11 months ago
Inferring Type Isomorphisms Generically
Abstract. Datatypes which differ inessentially in their names and structure are said to be isomorphic; for example, a ternary product is isomorphic to a nested pair of binary prod...
Frank Atanassow, Johan Jeuring
DATE
2003
IEEE
105views Hardware» more  DATE 2003»
15 years 11 months ago
Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev...
DATE
2003
IEEE
76views Hardware» more  DATE 2003»
15 years 11 months ago
Modeling and Evaluation of Substrate Noise Induced by Interconnects
Interconnects have deserved attention as a source of crosstalk to other interconnects, but have been ignored as a source of substrate noise. In this paper, we evaluate the importa...
Ferran Martorell, Diego Mateo, Xavier Aragon&egrav...
DATE
2003
IEEE
105views Hardware» more  DATE 2003»
15 years 11 months ago
Detecting Soft Errors by a Purely Software Approach: Method, Tools and Experimental Results
In this paper is described a software technique allowing to detect soft errors occurring in processor-based digital architectures. The detection mechanism is based on a set of rul...
B. Nicolescu, Raoul Velazco
DATE
2002
IEEE
96views Hardware» more  DATE 2002»
15 years 11 months ago
Modeling Techniques and Tests for Partial Faults in Memory Devices
: It has always been assumed that fault models in memories are sufficiently precise for specifying the faulty behavior. This means that, given a fault model, it should be possible...
Zaid Al-Ars, A. J. van de Goor