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» BASE: Using Abstraction to Improve Fault Tolerance
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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
16 years 6 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
HYBRID
2011
Springer
14 years 6 months ago
Reputation-based networked control with data-corrupting channels
We examine the problem of reliable networked control when the communication channel between the controller and the actuator periodically drops packets and is faulty i.e., corrupts...
Shreyas Sundaram, Jian Chang, Krishna K. Venkatasu...
EMSOFT
2005
Springer
15 years 12 months ago
Compiler-guided register reliability improvement against soft errors
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Jun Yan, Wei Zhang
ISCA
1999
IEEE
187views Hardware» more  ISCA 1999»
15 years 10 months ago
Area Efficient Architectures for Information Integrity in Cache Memories
Information integrity in cache memories is a fundamental requirement for dependable computing. Conventional architectures for enhancing cache reliability using check codes make it...
Seongwoo Kim, Arun K. Somani
JIRS
2007
108views more  JIRS 2007»
15 years 6 months ago
Task-based Hardware Reconfiguration in Mobile Robots Using FPGAs
This paper presents a methodology for the realization of intelligent, task-based reconfiguration of the computational hardware for mobile robot applications. Task requirements are ...
Sesh Commuri, V. Tadigotla, L. Sliger