In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
We examine the problem of reliable networked control when the communication channel between the controller and the actuator periodically drops packets and is faulty i.e., corrupts...
Shreyas Sundaram, Jian Chang, Krishna K. Venkatasu...
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Information integrity in cache memories is a fundamental requirement for dependable computing. Conventional architectures for enhancing cache reliability using check codes make it...
This paper presents a methodology for the realization of intelligent, task-based reconfiguration of the computational hardware for mobile robot applications. Task requirements are ...