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» BASE: Using Abstraction to Improve Fault Tolerance
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DATE
2009
IEEE
131views Hardware» more  DATE 2009»
16 years 1 months ago
An event-guided approach to reducing voltage noise in processors
Abstract—Supply voltage fluctuations that result from inductive noise are increasingly troublesome in modern microprocessors. A voltage “emergency”, i.e., a swing beyond tol...
Meeta Sharma Gupta, Vijay Janapa Reddi, Glenn H. H...
AMFG
2005
IEEE
181views Biometrics» more  AMFG 2005»
16 years 4 days ago
An Integrated Two-Stage Framework for Robust Head Pose Estimation
Abstract. Subspace analysis has been widely used for head pose estimation. However, such techniques are usually sensitive to data alignment and background noise. In this paper a tw...
Junwen Wu, Mohan M. Trivedi
ISSTA
2010
ACM
15 years 10 months ago
On test repair using symbolic execution
When developers change a program, regression tests can fail not only due to faults in the program but also due to outof-date test code that does not reflect the desired behavior ...
Brett Daniel, Tihomir Gvero, Darko Marinov
ATVA
2006
Springer
153views Hardware» more  ATVA 2006»
15 years 10 months ago
Learning-Based Symbolic Assume-Guarantee Reasoning with Automatic Decomposition
Abstract. Compositional reasoning aims to improve scalability of verification tools by reducing the original verification task into subproblems. The simplification is typically bas...
Wonhong Nam, Rajeev Alur
INFORMATICALT
2008
154views more  INFORMATICALT 2008»
15 years 6 months ago
A Novel Biometric Personal Verification System Based on the Combination of Palmprints and Faces
Abstract. This paper presents a bimodal biometric verification system based on the fusion of palmprint and face features at the matching-score level. The system combines a new appr...
Slobodan Ribaric, Ivan Fratric, Kristina Kis